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Experimental determination of the surface ionisation in electron probe microanalysisBASTIN, G. F; DIJKSTRA, J. M; HEIJLIGERS, H. J. M et al.Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 219-223, issn 0254-0584, 5 p.Conference Paper

Electron probe microanalysis (EPMA)OHMORI, Toshihide.Japanese journal of tribology. 2005, Vol 50, Num 4, pp 421-427, issn 1045-7828, 7 p.Article

The history and the current status of biological electron-probe X-ray microanalysisHALL, T. A.Micron and microscopica acta. 1986, Vol 17, Num 2, pp 91-100, issn 0739-6260Article

QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF BIOLOGICAL THIN SECTIONS: METHODS AND VALIDITY.SHUMAN H; SOMLYO AV; SOMLYO AP et al.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 1; NO 4; PP. 317-339; BIBL. 48 REF.Article

COLLOQUE SUR LA MICROANALYSE A SONDE ELECTRONIQUE; BELLEVUE; 19731974; J. MICR.; FR.; DA. 1974; VOL. 20; NO 2; PP. 83-112; BIBL. DISSEM.Conference Paper

ELECTRON PROBE ANALYSIS OF REFRACTIVE BODIES IN AMOEBA PROTEUS = ANALYSE PAR SONDE ELECTRONIQUE DE CORPS REFRINGENTS CHEZ A. P.COLEMAN JR; NILSSON JR; WARNER RR et al.1973; EXPER. CELL RES.; U.S.A.; DA. 1973; VOL. 76; NO 1; PP. 31-40; BIBL. 11 REF.Serial Issue

NUCLEAR REACTOR INSTRUMENTATION EMPLOYING MICROWAVE TECHNIQUESBILLETER TR.1972; HEDL-TME-72-25; U.S.A.; DA. 1972; PP. 1-47; BIBL. 16 REF.; MICROFICHEReport

Towards sub-Å electron beamsKRIVANEK, O. L; DELLBY, N; LUPINI, A. R et al.Ultramicroscopy. 1999, Vol 78, Num 1-4, pp 1-11, issn 0304-3991Conference Paper

How can toxic elements (Pb, Ti) be localized in histological sections by electronprobe x-ray microanalysis (EPMA)?BARCKHAUS, R. H; SCHMIDT, P. F.Progress in histochemistry and cytochemistry. 1991, Vol 23, Num 1-4, pp 332-341, issn 0079-6336Article

Electron probe microanalysis of cryosections from cell suspensionsZIEROLD, K.Methods in microbiology. 1988, Vol 20, pp 91-111, issn 0580-9517Article

Conception et exploitation d'une sonde électronique d'auscultation des réseaux d'assainissement urbains non visitablesBEDRANI, M.1983, 187 pThesis

Absolute quantitative electron microscopy of thin biological specimens by energy-dispersive X-ray microanalysis and densitometric mass determinationLINDERS, P. W. J; VAN DE VORSTENBOSCH, R. A; SMITS, H. T. J et al.Analytica chimica acta. 1984, Vol 160, pp 57-67, issn 0003-2670Article

The role of field emission in submicron electron beam testingSWANSON, L. W; TUGGLE, D; JIA-ZHENG LI et al.Thin solid films. 1983, Vol 106, Num 4, pp 241-255, issn 0040-6090Article

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ELECTRON COLLECTION BY BLUNT PROBES IN THE LOWER IONOSPHEREYORK TM; WU CI; LAI TWK et al.1980; AIAA J.; ISSN 0001-1452; USA; DA. 1980; VOL. 18; NO 7; PP. 808-816; BIBL. 26 REF.Article

A SIMPLE METHOD FOR DETERMINING THE ACCELERATION POTENTIAL IN ELECTRON PROBES AND SCATTERING ELECTRON MICROSCOPESSOLOSKY LF; BEAMAN DR.1972; REV. SCI. INSTRUM.; U.S.A.; DA. 1972; VOL. 43; NO 8; PP. 1100-1102; BIBL. 3 REF.Serial Issue

ELEKTRONENSTRAHL PRUEFT ELEKTRISCHE POTENTIALE IN INTEGRIERTEN SCHALTUNGEN = MESURES DES POTENTIELS ELECTRIQUES DANS LES CIRCUITS INTEGRES A L'AIDE D'UNE SONDE ELECTRONIQUEFAZEKAS P.1981; TM, TECH. MESS.; ISSN 0171-8096; DEU; DA. 1981; VOL. 48; NO 1; PP. 29-35; ABS. ENG; BIBL. 12 REF.Article

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ELECTRON PROBE MICROANALYSIS OF SKELETAL MUSCLE = MICROANALYSE PAR SONDE ELECTRONIQUE DU MUSCLE STRIEYAROM R; CHANDLER JA.1974; J. HISTOCHEM. CYTOCHEM.; U.S.A.; DA. 1974; VOL. 22; NO 3; PP. 147-154; BIBL. 23REF.Article

Addition of different contributions to the charged particle probe sizeBARTH, J. E; KRUIT, P.Optik (Stuttgart). 1996, Vol 101, Num 3, pp 101-109, issn 0030-4026Article

An effective coal liquefaction solvent obtained from the vacuum pyrolysis of waste rubber tiresORR, E. C; SHI, Y; JI, Q et al.Energy & fuels. 1996, Vol 10, Num 3, pp 573-578, issn 0887-0624Conference Paper

Performance and limitations of electron probe microanalysis applied to the characterization of coatings and layered structuresWILLICH, P; BETHKE, R.Fresenius' journal of analytical chemistry. 1995, Vol 353, Num 3-4, pp 389-392, issn 0937-0633Conference Paper

A study of back-trap mottle in coated papers using electron probe microanalysisWHALEN-SHAW, M; EBY, T.Tappi journal. 1991, Vol 74, Num 12, pp 188-194, issn 0734-1415Conference Paper

Le diagnostic des circuits intégrés par faisceau d'électrons = Electron beam diagnosis of integrated circuitsFOURNIER, J.-M; VERNAY, Y.-J.Annales des télécommunications. 1988, Vol 43, Num 7-8, pp 443-459, issn 0003-4347Article